Monday, August 8, 2022

1:00 PM - 2:00 PM

The seminar will take place from 1-2 p.m. PDT in Physics 325 South. Our speaker is Thomas Juffmann (Universitat Wien). Details are below.

From information theory to novel imaging techniques

Various imaging and scattering techniques rely on the measurement of phase shifts. Prominent examples include quantitative phase microscopy, holography, X-ray scattering, and cryo-electron microscopy. We discuss these techniques in terms of Fisher information and associated Cramer-Rao bounds, enabling us to calculate the achievable measurement sensitivity for a given technique. In an imaging scenario, we show that wavefront shaping enables optimal phase measurements even for thick specimens and discuss the prospect of such measurements in light and electron microscopy. Finally, we discuss techniques that enable measurements beyond classical limits via quantum correlations, cavity enhancement, or hybrid measurement technology.

Fundamental Bounds on the Precision of Classical Phase Microscopes, D. Bouchet, J. Dong, D. Maestre, and T. Juffmann, Phys. Rev. Appl., 15(2), 024047 (2021)
T. Juffmann, A. De los Rios Sommer, S. Gigan, Local Optimization of Wave-fronts for optimal sensitivity PHase Imaging (LowPhi), Optics Communications, 454, 124484 (2020).
M. C. Chirita Mihaila, P. Weber, M. Schneller, L. Grandits, S. Nimmrichter, T. Juffmann, Transverse electron beam shaping with light, arXiv:2203.07925 (2022).
R. Marchand, R. Šachl, M. Kalbáč, M. Hof, R. Tromp, M. Amaro, S. J. van der Molen and T. Juffmann, Optical Near-Field Electron Microscopy, Phys. Rev. Applied 16, 014008 (2021)